The Fraunhofer IST has two scanning electron microscopes with EDX detectors, as well as an electron beam microprobe (EPMA) with 5 WDX detectors. In the field of microanalysis, it can be used to image surfaces with high resolution and perform chemical point analysis with micrometer resolution. Advantages of these methods:
The Fraunhofer IST has 30 years of experience in the industrial application of these methods, e.g. for damage analysis, material and coating development, corrosion and adhesion problems, market observation, etc.
EPMA Linescan over a spherical graphite precipitation in cast iron. Detection of 0.13 wt.% boron enrichment in the particle shell and 0.03 wt.% phosphorus in the particle interior. Detection limit typically 0.01 at%.
Mapping of Ni distribution in a rolled steel sheet over an area of 2x10 mm2. Deviations from the mean Ni content of ± 0.4 weight% are shown.
Non-destructive layer thickness determination and simultaneous characterization of the chemical composition of a NiCr/GdTbFe double layer. Comparing measurements using EPMA and independent RBS (Rutherford Backscattering Spectroscopy) measurement shows the high level of accuracy in layer thickness and composition.