A B C D E F G H I J L M N O P Q S T W X Z
A
Analytics und quality assurance
Application Center for Plasma and Photonics
Atmospheric pressure plasma processes
B
C
Carbon fiber reinforced plastic (CFRP)
CFRP (Carbon fiber reinforced plastic)
Chemical vapour deposition (CVD)
CLM (Confocal laser microscope)
Confocal laser microscope (CLM)
CVD (Chemical vapour deposition)
D
DOC – Dortmunder OberflächenCentrum
DSMC – Direct Simulation Monte Carlo
E
EDX (Energy dispersive X-ray spectroscopy)
Electrical functional coatings
Electron probe micro analysis (EPMA)
Energy dispersive X-ray spectroscopy (EDX)
EPMA (Electron probe micro analysis)
F
G
GDOES (Glow Discharge Optical Emission Spectroscopy)
Glow Discharge Optical Emission Spectroscopy (GDOES)
H
High Power Impulse Magnetron Sputtering (HIPIMS)
HIPIMS (High power impulse magnetron sputtering)
Hot filament CVD processes (HFCVD)
Hot wire CVD processes (HWCVD)
HWCVD (Hot wire CVD processes)
I
J
L
Laser plasma hybrid technology / Laser plasma hybrid processes
M
N
O
P
PACVD (Plasma-activated chemical vapour deposition)
PECVD (Plasma-enhanced chemical vapour deposition)
Photocatalytical measurement technology
Physical vapour deposition (PVD)
PIC-MC – Particle-in-Cell Monte Carlo Simulation
Project Center for Energy Storage and Systems ZESS
PVD (Physical vapour deposition)
Q
S
Scanning electron microscope (SEM)
Scanning tunneling microscope (STM)
Secondary ion mass spectrometry (SIMS)
SEM (Scanning electron microscope)
Sensor and actuator technology
SIMS (Secondary ion mass spectrometry)
STM (Scanning tunneling microscope)
T
TCO (Transparent conductive oxides)
Transparent conductive oxides (TCO)
W
X
XPS (X-ray photoelectron spectroscopy)
X-ray photoelectron spectroscopy (XPS)